Information-Rich Manufacturing Metrology-Reference-Cited by-同舟云学术

Information-Rich Manufacturing Metrology

Published:2018-12-31 Issue: Volume: Page:145-157
ISSN:1868-4238
Container-title:Precision Assembly in the Digital Age
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Author:

Leach Richard,Bointon Patrick,Feng Xiaobing,Lawes Simon,Piano Samanta,Senin Nicola,Sims-Waterhouse Danny,Stavroulakis Petros,Su Rong,Syam Wahyudin,Thomas Matthew

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-030-05931-6_14

Reference42 articles.

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2. Amigoni, F., Brandolini, A., D’Antona, G., Ottoboni, R., Somalvico, M.: Artificial intelligence in science of measurements: from measurement instruments to perceptive agencies. IEEE Trans. Instrum. Meas. 52, 716–723 (2003)

3. Boreman, G.D.: Modulation Transfer Function in Optical and Electro-Optical Systems. SPIE Press, Bellingham (2001)

4. Bruzzone, A.A.G., Costa, H.L., Lonardo, P.M., Lucca, D.A.: Advances in engineered surfaces for functional performance. Ann. CIRP 57, 750–769 (2008)

5. Coupland, J.M., Lobera, J.: Measurement of steep surfaces using white light interferometry. Strain 4, 69–78 (2010)

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