Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays

Author:

Gray Struan,Axelsson Stefan

Publisher

Springer International Publishing

Reference24 articles.

1. S. Axelsson, A Preliminary Attempt to Apply Detection and Estimation Theory to Intrusion Detection, Technical Report 00-4, Department of Computer Engineering, Chalmers University of Technology, Goteborg, Sweden, 2000.

2. E. Biham and A. Shamir, Differential fault analysis of secret key cryptosystems, Proceedings of the Seventeenth Annual International Cryptology Conference, pp. 513–525, 1997.

3. G. Binnig, C. Quate and C. Gerber, Atomic force microscope, Physical Review Letters, vol. 56, pp. 930–933, 1986.

4. G. Binnig and H. Rohrer, Scanning tunneling microscopy, Helvetica Physica Acta, vol. 55, pp. 726–735, 1982.

5. Bruker, Innova, Billerica, Massachusetts ( www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/innova/overview.html ), 2019.

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