Short-Circuit Operation of a 650-V/60-A GaN-Based Half-Bridge
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Publisher
Springer Nature Switzerland
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-48711-8_34
Reference12 articles.
1. Chen, K.J., et al.: GaN-on-si power technology: devices and applications. IEEE Trans. on Elect. Dev. 64(3), 779–795 (2017)
2. Li, H., et al.: Robustness of 650-V enhancement-mode GaN HEMTs under various short-circuit conditions. IEEE Trans. on Ind. App. 55(2), 1807–1816 (2019)
3. Riccio, M., et al.: Experimental analysis of electro-thermal interaction in normally-off pGaN HEMT devices. In: 2018 IEEE International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles & International Transportation Electrification Conference (ESARS-ITEC) ESARS-ITEC, Nottingham, UK, pp. 1–6 (2018)
4. Sun, J., Wei, J., Zheng, Z., Lyu, G., Chen, K.J.: Distinct short circuit capability of 650-V p-GaN gate HEMTs under single and repetitive tests. In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD), pp. 313–316 (2020)
5. Fernández, M., et al.: Short-circuit study in medium-voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs. IEEE Trans. Industr. Electron. 64(11), 9012–9022 (2017). https://doi.org/10.1109/TIE.2017.2719599
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