Effects of Transient Faults in Integrated Circuits
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-29353-6_1
Reference65 articles.
1. Abramovici, M., Breuer, M. A., & Friedman, A. D. (1994). Digital systems testing and testable design. Hoboken: Wiley.
2. Barenghi, A., Breveglieri, L., Koren, I., & Naccache, D. (2012). Fault injection attacks on cryptographic devices: Theory, practice, and countermeasures. Proceedings of the IEEE 100(11), 3056–3076.
3. Baumann, R. C. (2005). Radiation-induced soft errors in advanced semiconductor technologies. IEEE Transactions on Device and Materials Reliability 5(3), 305–316.
4. Borkar, S. (2005). Designing reliable systems from unreliable components: The challenges of transistor variability and degradation. IEEE Micro, 25(6), 10–16.
5. Buchner, S. P., Miller, F., Pouget, V., & McMorrow, D. P. (2013). Pulsed-laser testing for single-event effects investigations. IEEE Transactions on Nuclear Science, 60(3), 1852–1875.
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Machine Learning-Based Approach for Hardware Faults Prediction;IEEE Transactions on Circuits and Systems I: Regular Papers;2020-11
2. Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron-Induced Transients;IEEE Transactions on Nuclear Science;2020-07
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