Test object for emission electron microscope-Reference-Cited by-同舟云学术

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Test object for emission electron microscope

Published:2013-10-17 Issue:4 Volume:114 Page:1383-1385
ISSN:0947-8396
Container-title:Applied Physics A
language:en
Short-container-title:Appl. Phys. A

Author:

Chernov S. V.,Makukha Z. M.,Protsenko I. Y.,Nepijko S. A.,Elmers H. J.,Schönhense G.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s00339-013-8010-y.pdf

Reference11 articles.

1. http://www.specs.de

2. http://www.elmitec.de

3. A. Locatelli, E. Bauer, Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM. J. Phys. Condens. Matter 20(9), 093002 (2008)

4. J. Feng, E. Forest, A.A. MacDowell, M. Marcus, H. Padmore, S. Raoux, D. Robin, A. Scholl, R. Schlueter, P. Schmid, J. Stöhr, W. Wan, D.H. Wei, Y. Wu, An x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materials. J. Phys. Condens. Matter 17(16), S1339 (2005)

5. Th. Schmidt, U. Groh, R. Fink, E. Umbach, O. Schaff, W. Engel, B. Richter, H. Kuhlenbeck, R. Schlögl, H.-J. Freund, A.M. Bradshaw, D. Preikszas, P. Hartel, R. Spehr, H. Rose, G. Lilienkamp, E. Bauer, G. Benner, XPEEM with energy-filtering: advantages and first results from the SMART project. Surf. Rev. Lett. 9(1), 223 (2002)

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