An x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materials-Reference-Cited by-同舟云学术

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An x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materials

Published:2005-04-08 Issue:16 Volume:17 Page:S1339-S1350
ISSN:0953-8984
Container-title:Journal of Physics: Condensed Matter
language:
Short-container-title:J. Phys.: Condens. Matter

Author:

Feng J,Forest E,MacDowell A A,Marcus M,Padmore H,Raoux S,Robin D,Scholl A,Schlueter R,Schmid P,Stöhr J,Wan W,Wei D H,Wu Y

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

Link

http://stacks.iop.org/0953-8984/17/i=16/a=005/pdf

Reference52 articles.

1. Elektronenmikroskopische Abbildung mit lichtelektrischen Elektronen

2. Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy

3. An electrostatic microscope for synchrotron radiation x‐ray absorption microspectroscopy (invited)

4. Sub-micron spatial resolution of a micro-XAFS electrostatic microscope with bending magnet radiation: Performance assessments and prospects for aberration correction

5. The development of electron spectromicroscopy

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