1. M. Warwick, J. Surface-Mount Technol., 12 (October 1000), pp. 14–19.
2. Y. Zang, CircuitTree (November 1999), pp. 28–33.
3. G.T. Galyon, IEEE Trans. Electron. Packag. Manuf., 28 (2005), p. 94.
4. P. Bush, G.L. Jones, and I. Boguslavasky, “Recrystallization Principles Applied to Whisker Growth in Tin,” (paper presented at the NEMI Workshop on Tin Whiskers, APEX 2003, Anaheim, CA, 1 April 2003).
5. J.W. Osenbach, R.L. Shook, B.T. Vaccaro, B.D. Potteiger, A.N. Amin, K.N. Hooghan, S. Suratkar, and P. Ruengsinsub, IEEE Trans. Electron. Packag. Manuf., 28(1) (2005), pp. 36–62.