Screening for counterfeit electronic parts-Reference-Cited by-同舟云学术

Screening for counterfeit electronic parts

Published:2011-08-23 Issue:10 Volume:22 Page:1511-1522
ISSN:0957-4522
Container-title:Journal of Materials Science: Materials in Electronics
language:en
Short-container-title:J Mater Sci: Mater Electron

Author:

Sood Bhanu,Das Diganta,Pecht Michael

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s10854-011-0500-0.pdf

Reference16 articles.

1. J. Parker, C. Turgoose, An Analysis of the Excess Electronic Components Market (HP Laboratories, Bristol, February, 1999)

2. K. Chatterjee, D. Das, Semiconductor manufacturers’ efforts to improve trust in the electronic part supply chain. Compon. Packag. Tech. IEEE Trans. 30(3), 547–549 (2007)

3. K. Chatterjee, D. Das, M. Pecht, P. Suorsa, C. Ricci, Solving the counterfeit electronics problem. Proceedings of Panpacific Microelectronics Symposium (SMTA), Jan. 30–Feb. 1, pp. 294–300, 2007

4. M. Pecht, S. Tiku, Bogus: electronic manufacturing and consumers confront a rising tide of counterfeit electronics. IEEE Spectr. 43(5), 37–46 (2006)

5. K. Snider, A time for change: the not so hidden truth behind the Chinese open market. ERAI special report, 2007

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