Influence of different conducting substrates on magnetic properties of electrodeposited Ni–Fe thin films-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Influence of different conducting substrates on magnetic properties of electrodeposited Ni–Fe thin films

Published:2017-11-25 Issue:5 Volume:29 Page:3715-3721
ISSN:0957-4522
Container-title:Journal of Materials Science: Materials in Electronics
language:en
Short-container-title:J Mater Sci: Mater Electron

Author:

Manimaran Ezhil Inban,Antonyraj K.,Navaneetha Emerson Rajamony,kumar V. Sathish,Rajesh P.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/article/10.1007/s10854-017-8304-5/fulltext.html

Reference20 articles.

1. D.J. Landolt, Electrochem. Soc 149(3), S9-S20 (2002)

2. E.I. Manimaran, E.R. Navaneetha J. Mater. Sci 26(12), 9821–9826 (2015)

3. T. Baskar, K.S. Rajni, R. Kannan Int. J. Adv. Technol. Eng. Sci 2(10), 293–299 (2014)

4. K. Mohan, R. Kadiresan, V. Senthilkumar, Int. J. Adv. Res. Sci. Eng. 5(7), 285–292 (2016)

5. V.C. Kieling, Surf. Coat. Technol. 96, 135–139, (1997)

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improvement of some physical and magnetic properties of nanocrystalline Fe15–Ni85/ITO thin films by galvanostatic pretreatment process;Materials Today Communications;2023-06

2. THE ROLE OF DEPOSITION TEMPERATURE ON PARTICLE SIZE, ROUGHNESS PARAMETERS, MAGNETIC AND STRUCTURAL FEATURES OF ELECTROCHEMICALLY GROWN Ni–Fe/ITO SAMPLES;Digest Journal of Nanomaterials and Biostructures;2021-01

3. Effect of dislocation density on adhesion strength of electroforming Ni layer on Cu substrate;Journal of Adhesion Science and Technology;2018-11-19

4. Structural and magnetoresistive properties of electrodeposited thin films for magnetic sensors applications;Journal of Materials Science: Materials in Electronics;2018-05-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3