Exact adjustment of monocrystals on many-crystal X-ray equipment-Reference-Cited by-同舟云学术

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Exact adjustment of monocrystals on many-crystal X-ray equipment

Published:1962-09 Issue:9 Volume:12 Page:695-702
ISSN:0011-4626
Container-title:Czechoslovak Journal of Physics
language:en
Short-container-title:Czech J Phys

Author:

Bubáková R.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF01701671.pdf

Reference5 articles.

1. Brogren G.: Arkiv f. Fys.3 (1951), 507.

2. šolc I.: čs. čas. fys.8 (1958), 739.

3. Compton A. H., Allison S. K.: X-Rays in Theory and Experiment, D. van Nostrand Co., Inc., New York 1949, 726.

4. Borovskij J., Smidt V. V.: Izv. AN SSSR (ser. fiz.)21 (1957), 1412.

5. Bubáková R., Drahokoupil J., Fingerland A.: Czech. J. Phys.B 11 (1961), 199.

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1. Zur Übereinstimmung der Dynamischen Theorie der Röntgenstrahl-Interferenzen mit Experimenten im Bragg-Fall 1;Zeitschrift für Kristallographie - Crystalline Materials;1995-06-01

2. X-ray investigations of GaP:N,S epitaxial layers applied in light emitting diodes;Journal of Crystal Growth;1989-05

3. Photoelastic and X-ray topographic studies of residual stress and lattice deformation in GaAs single crystals;Crystal Research and Technology;1988-07

4. X-ray spherical-wave diffraction in the bragg case for bent Si crystals;Physica Status Solidi (a);1987-02-16

5. The deformation by stress relaxation at the edge dislocation;physica status solidi (a);1982-04-16

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