Photoelastic and X-ray topographic studies of residual stress and lattice deformation in GaAs single crystals
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference18 articles.
1. , : The XVI International School on the Physics of Semiconducting Compounds Jaszowiec-Ustron (Poland), April 6–12, Abstracts II (1987) 158
2. The application of elastobirefringence to the study of strain fields and dislocations in III–V compounds
3. The analysis of dislocations in strained III‐V semiconductor crystals using elastobirefringence
4. Infrarotspannungsoptische Untersuchungen an Halbleitereinkristallen
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