1. G. M. Martin and D. Bois, Proc. Electrochem. Soc., Semi-conductor Characterization Techniques, Edtr. P. A. Barnes,78, 32 (1978). The acronym PITS (photoinduced transient spectroscopy) is also used but OTCS, has the advantage of indicating that a current transient is involved. PICTS (photoinduced current transient spectroscopy) (2) is better in this respect. The technique known as optical DLTS (3) does not represent OTCS but a capacitance DLTS technique in which a light rather than a voltage pulse is used.
2. J. Rhee and P. K. Bhattacharya, J. Appl. Phys.53, 4247 (1982).
3. S. K. Brierly, J. Appl. Phys.61, 567 (1987).
4. D. V. Lang, J. Appl. Phys.45, 3023, (1974).
5. C. Hurtes, M. Boulou, A. Mitonneau and D. Bois, Appl. Phys. Lett.32, 821 (1978).