ROLE OF ANNEALING TEMPERATURE ON THE STRUCTURAL, MORPHOLOGICAL AND OPTICAL CHARACTERIZATIONS OF SnO2 THIN FILMS SYNTHESIZED BY SPIN-COATING METHOD

Abstract

The inuence of annealing temperature on the structural, morphological, and optical properties of SnO thin lms 2 prepared by spin-coating method has been studied. The samples were thermally annealed at 673 K and 773 K for 2 hrs. Powder XRD analysis of the thin lms annealed at 673 and 773 K shows less intense and broad diffraction peaks. The size of the grains found to increase with annealing temperature. The grain size of the synthesized lm is enhanced due to increasing annealing temperature upto 773 K. The grains are well agglomerated for lms annealed at the higher temperature of 773 K. The transmission spectra of SnO thin lms annealed at the 2 temperatures of 673 and 773 K was analyzed. The percentage of transmittance found to increase from 56 to 91% with an increase in the annealing temperature from room temperature to 773 K. The bandgap energy value (Eg) was calculated and it increases from 3.25 to 3.35 eV with the increase in annealing temperatures.