Semi-Supervised Learning for Maximizing the Partial AUC

Author:

Iwata Tomoharu,Fujino Akinori,Ueda Naonori

Abstract

The partial area under a receiver operating characteristic curve (pAUC) is a performance measurement for binary classification problems that summarizes the true positive rate with the specific range of the false positive rate. Obtaining classifiers that achieve high pAUC is important in a wide variety of applications, such as cancer screening and spam filtering. Although many methods have been proposed for maximizing the pAUC, existing methods require many labeled data for training. In this paper, we propose a semi-supervised learning method for maximizing the pAUC, which trains a classifier with a small amount of labeled data and a large amount of unlabeled data. To exploit the unlabeled data, we derive two approximations of the pAUC: the first is calculated from positive and unlabeled data, and the second is calculated from negative and unlabeled data. A classifier is trained by maximizing the weighted sum of the two approximations of the pAUC and the pAUC that is calculated from positive and negative data. With experiments using various datasets, we demonstrate that the proposed method achieves higher test pAUCs than existing methods.

Publisher

Association for the Advancement of Artificial Intelligence (AAAI)

Subject

General Medicine

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Weakly Supervised AUC Optimization: A Unified Partial AUC Approach;IEEE Transactions on Pattern Analysis and Machine Intelligence;2024-07

2. Doubly Robust AUC Optimization against Noisy and Adversarial Samples;Proceedings of the 29th ACM SIGKDD Conference on Knowledge Discovery and Data Mining;2023-08-04

3. AUC Maximization in the Era of Big Data and AI: A Survey;ACM Computing Surveys;2022-12-23

4. Transfer Anomaly Detection for Maximizing the Partial AUC;2022 International Joint Conference on Neural Networks (IJCNN);2022-07-18

5. SaR: Self-adaptive Refinement on Pseudo Labels for Multiclass-Imbalanced Semi-supervised Learning;2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW);2022-06

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