Low Power Embedded SoC Design-Reference-Cited by-同舟云学术

Low Power Embedded SoC Design

Published:2023-03-30 Issue:1 Volume:3 Page:1-10
ISSN:2582-8843
Container-title:Indian Journal of VLSI Design
language:
Short-container-title:IJVLSID

Author:

Sasikala Dr. G.^ORCID, ,Krishna G. Satya^ORCID,

Abstract

Now a days all embedded processors are manufactured in such a way that it may consume low power to provide longer life to the system using various low power techniques like clock gating, data gating, variable frequency mechanism, variable voltage mechanism and variable threshold techniques. In this paper these techniques are implemented using VHDL language in Vivado and results are compared to identify the better one among all possible ones. There are various characteristics compared here are power consumption, number of look up tables and number of flip flops consumed.

Publisher

Lattice Science Publication (LSP)

Reference15 articles.

1. Himanshu Chaudhary, Nitish Goyal, Nagendra Sah, "Dynamic Power Reduction Using Clock Gating: A Review", IJECT Vol. 6, Issue 1, Jan - March 2015, ISSN: 2230- 7109 (Online) | ISSN: 2230-9543 (Print).

2. V.Keerthana, Prasanth.J, "An Optimal Exploration of Different Clock Gating Techniques in VLSI Circuits", SSRG International Journal of VLSI & Signal Processing (SSRG-IJVSP) - volume 3 Issue 4 July - August 2016, ISSN: 2394 - 2584.

3. Priya Singh, Ravi Goel, "Clock Gating: A Comprehensive Power Optimization Technique for Sequential Circuits", IJARCST 2014, Vol. 2, Issue 2, Ver. 2 (April - June 2014), ISSN: 2347 - 8446 (Online), ISSN: 2347 - 9817 (Print).

4. Dushyant Kumar Sharma, "Effects of Different Clock Gating Techniques on Design", International Journal of Scientific & Engineering Research Volume 3, Issue 5, May-2012 1 ISSN 2229- 5518.

5. Saurabh Kshirsagar, Dr. M B Mali, "A Review of Clock Gating Techniques in Low Power Applications", International Journal of Innovative Research in Science, Engineering and Technology (An ISO 3297: 2007 Certified Organization) Vol. 4, Issue 6, June 2015, ISSN (Online): 2319-8753, ISSN (Print): 2347-6710.