Cutting Edge Height Measurement of a Rotary Cutting Tool by a Laser Displacement Sensor

Author:

OSAWA Shinichi1,ITO So1,SHIMIZU Yuki1,JANG SungHo1,GAO Wei1,FUKUDA Tsutomu2,KATO Akira2,KUBOTA Kouji2

Affiliation:

1. Nano-Metrology and Control Laboratory, Department of Nanomechanics, Tohoku University

2. MMC RYOTEC CORPORATION

Publisher

Japan Society of Mechanical Engineers

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference15 articles.

1. (1) Gao, W., Precision Nanometrology: Sensors and Measuring Systems for Nanomanufacuting, (2010) Springer.

2. (2) Byrne, G., Dornfeld, D., Denkena, B. CIRP Annals - Manufacturing Technology, (2003), Vol. 52, Issue 2, pp. 483-507.

3. (3) Binnig, G., Quate C.F. and Gerber C. Atomic force microscope Physical Review Letters, vol. 56 (1986), pp.930-933.

4. (4) Gao, W., Motoki, T, and Kiyono, S, Nanometer edge profile measurement of diamond cutting tools by atomic force microscope with optical alignment sensor, Precision Engineering, Issue 30, (2006), pp. 396-405.

5. (5) Maeda, Y., Uchida H., and A. Yamamoto, Measurement of the geometric features of a cutting tool edge with the aid of a digital image processing technique, Precision Engineering, Vol. 11, Issue 3, (1989),pp. 165-171.

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