Effect of Substrates on Film Hardness Measurements of Nanometer Thick Amorphous Carbon Films-Reference-Cited by-同舟云学术

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Effect of Substrates on Film Hardness Measurements of Nanometer Thick Amorphous Carbon Films

Published:2009 Issue:12 Volume:3 Page:1233-1237
ISSN:1880-9871
Container-title:Journal of Solid Mechanics and Materials Engineering
language:en
Short-container-title:JMMP

Author:

AKASAKA Hiroki¹,ITO Hiroki¹,NAKANO Masayuki²,OHSHIO Shigeo¹,SAITOH Hidetoshi¹

Affiliation:

1. Depatment of Materials Science and Technology, Nagaoka University of Technology

2. Depatment of Chemical Science and Engineering, Tokyo National College of Technology

Publisher

Japan Society of Mechanical Engineers

Link

http://www.jstage.jst.go.jp/article/jmmp/3/12/3_12_1233/_pdf

Reference15 articles.

1. Tribological properties of segment-structured diamond-like carbon films

2. (2) X. D. Yang, T. Saito, Y. Nakamura, Y. Kondo and N. Ohtake, Dia. Relat. Mater. Vol. 13 (2004), pp. 1984-1988.

3. Electronic processes in hydrogenated amorphous carbon

4. (4) R. Hauert and U. Müller, Dia. Relat. Mater., Vol. 12 (2003), pp. 171-177.

5. (5) J. Koskinen, H. Ronkainen, S. Varjus, T. Muukkonen, K. Holmberg and T. Sajavaara, Dia. Relat. Mater., Vol. 10 (2001), pp. 1030-1035.

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