High Resolution Transmission Electron Microscopy of Aluminum/Mo-Coated Glass Substrate Interface Bonded by Ultrasonic Wire Welding
Author:
Affiliation:
1. Graduate School of Science and Technology, Kumamoto University
2. Toshiba Mitsubishi-Electric Industrial Systems Corporation
Publisher
Japan Society of Mechanical Engineers
Link
http://www.jstage.jst.go.jp/article/jmmp/5/12/5_12_803/_pdf
Reference22 articles.
1. (1) Murali, S., Srikanth, N., and Vath III, C. J., 2003, "Grains, deformation substructures, and slip bands observed in thermosonic copper ball bonding," Mater. Charact., 50(1), pp. 39-50.
2. (2) Krzanowski, J. E., 1990, "A Transmission Electron Microscopy Study of Ultrasonic Wire Bonding," IEEE Transactions on Components, Hybrids, and Manufacturing Technology.
3. (4) Brodyanski, A., Born, C., and Kopnarski, M., 2005, "Nm-scale resolution studies of the bond interface between ultrasonically welded Al-alloys by an analytical TEM: a path to comprehend bonding phenomena?," Appl. Surf. Sci., 252(1), pp. 94-97.
4. (5) Geissler, U., Schneider-Ramelow, M., Lang, K.-D., and Reichl, H., 2006, "Investigation of Microstructural Processes during Ultrasonic Wedge/Wedge Bonding of AlSi1 Wires," J. Electron. Mater.
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