1. (1) Goodwin, R., Miller, R., Tuv, E., Borisov, A., Janakiram, M. and Louchheim, S., “Advancements and Applications of Statistical Learning/Data Mining in Semiconductor Manufacturing”, Intel Technology Journal, Vol.8, Issue4(2004), pp.325
2. (2) Baldwin, C. Y. and Clark, K. B., “Design Rules”, The MIT Press(1999), pp.33-39
3. (3) Barkan, P., ”Strategic and Tactical Benefits of Simultaneous Engineering”, Design Management Journal, Vol. 2, No. 2 Spring(1991), pp.39-42
4. (4) 赤尾洋二, "品質展開入門", (1993), 日科技練
5. (5) 広瀬貞夫, "IPD革命", (2003), pp.86-107, 工業調査会