Development of a New Crack Identification Technique Based on Near-Tip Singular Electrothermal Field Measured by Lock-in Infrared Thermography.-Reference-Cited by-同舟云学术

Development of a New Crack Identification Technique Based on Near-Tip Singular Electrothermal Field Measured by Lock-in Infrared Thermography.

Published:2001 Issue:4 Volume:44 Page:528-534
ISSN:1344-7912
Container-title:JSME International Journal Series A
language:en
Short-container-title:JSME Int. J., Ser. A

Author:

SAKAGAMI Takahide¹,KUBO Shiro¹

Affiliation:

1. Department of Mechanical Engineering and Systems, Graduate School of Engineering, Osaka University

Publisher

Japan Society of Mechanical Engineers

Subject

Mechanical Engineering,General Materials Science

Link

http://www.jstage.jst.go.jp/article/jsmea/44/4/44_4_528/_pdf

Reference13 articles.

1. (1) Maldague, X.P.V., Nondestructive Evaluation of Materials by Infrared Thermography, (1993), Springer-Verlag.

2. (2) Snell, Jr., J.R. and Wurzbach, R.N. (ed.), Thermosense XX, Proceedings of SPIE, Vol. 3361 (1998).

3. (3) Sakagami, T. (ed.), Proceedings of the 2nd Symposium on Thermographic NDT & E Techniques, The Japanese Society for Non-Destructive Inspection, (in Japanese), (1998).

4. (4) Lesniak, J.R. and Bazile, D.J., Forced-Diffusion Thermography Technique and Projector Design, Proceedings of SPIE, Vol. 2766 (1996), pp. 210-217.

5. (5) Wu, D., Salerno, A., Schonbach, B., Hallin, H. and Busse, C., Phase-Sensitive Modulation Thermography and Its Applications for NDE, Proceedings of SPIE, Vol. 3056 (1997), pp. 176-183.

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