DEVELOPING A METHOD FOR DISTRIBUTION OF DECAP CELLS TO REDUCE THE DYNAMIC IR DROP IN THE POWER SUPPLY AND THE INCREASE IN RELIABILITY

Abstract

A method is presented for distribution of decap cells, which increases their number in the integrated circuit by ~14% compared to the classical approach, as a result of which the dynamic IR drop in the circuit is reduced by ~25%. At the initial stage, the method reduces the static power consumption of the integrated circuit, due to which it is possible to increase the additional decap cells. Some integrated circuits are simulated using the aging logic cell models. The obtained results of static time analysis, as well as data on energy consumption, show that the application of the proposed method does not affect the durability of the integrated circuit. The proposed method can be easily integrated into the automated design process of integrated circuits with mixed signals.