Affiliation:
1. NASA Lewis Research Center, Cleveland, OH 44135
Abstract
The reliability of microfocus x-radiography and scanning laser acoustic microscopy for detecting microvoids in silicon nitride and silicon carbide was statistically evaluated. Materials and process-related parameters that influenced the statistical findings in research samples are discussed. The use of conventional x-radiography in controlling and optimizing the processing and sintering of an Si3N4-SiO2-Y2O3 composition designated NASA 6Y is described. Radiographic evaluation and guidance helped develop uniform high-density Si3N4 modulus-of-rupture bars with improved four-point flexural strength (857, 544, and 462 MPa at room temperature, 1200°C, and 1370°C, respectively) and reduced strength scatter.
Subject
Mechanical Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Fuel Technology,Nuclear Energy and Engineering
Cited by
2 articles.
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