Radiation Thermometry at a High-Speed Turning Process

Author:

Mu¨ller Bernhard1,Renz Ulrich1,Hoppe Stefan2,Klocke Fritz2

Affiliation:

1. Lehrstuhl fu¨r Wa¨rmeu¨bertragung und Klimatechnik (WU¨K), RWTH Aachen, Eilfschornsteinstr. 18, 52056 Aachen, Germany

2. Lehrstuhl fu¨r Technologie der Fertigungsverfahren (WZL), RWTH Aachen, Steinbachstr. 53, 52074 Aachen, Germany

Abstract

A fiber-optic two-color pyrometer with high spatial and temporal resolution has been applied to measure temperatures at an external turning process. Different measurement positions have been realized at the chip and the workpiece. The measurements have been performed at three different workpiece materials: carbon steel AISI 1045, aluminum alloy AA 7075, and titanium alloy Ti6Al4V. The influences of different parameters like cutting speed, feed, and position of the measurement spot on the temperatures have been investigated. The cutting speed has been increased from conventional values up to 100 m/s for AISI 1045, 117 m/s for AA 7075, and 10 m/s for Ti6Al4V. Additionally, a review of radiation thermometry techniques and applications regarding time resolved temperature measurements in metal cutting will be presented.

Publisher

ASME International

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Control and Systems Engineering

Reference35 articles.

1. Ko¨nig, W. , 1987, “Chancen und Restriktionen der Hochgeschwindigkeitszerspanung,” VDI-Z, 130(6), pp. 35–41.

2. Schmidt, A. O. , 1953, “Temperaturmessungen am Werkstu¨ck, Werkzeug und Span,” Werkstattstechnik und Maschinenbau, 43(8), pp. 345–350.

3. Schulz, H. , 1989, “Aspects in Cutting Mechanism in High Speed Cutting,” CIRP Ann., 38(1), pp. 51–54.

4. Klocke, F., and Hoppe, S., 2001, “Mechanisms of Chip Formation in High Speed Cutting,” Scientific Fundamentals of HSC, H. Schulz, ed., Carl Hanser Verlag, Mu¨nchen—Wien, pp. 1–10.

5. Mu¨ller, B., and Renz, U., 2001, “Development of a Fast Fiber-Optic Two-Color Pyrometer for the Temperature Measurement of Surfaces With Varying Emissivities,” Rev. Sci. Instrum., 72(8), pp. 3366–3374.

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