Buckling of Stressed and Pressurized Thin Films on Substrates

Author:

Dion Éloi1,Grilhé Jean2,Colin Jérôme2,Coupeau Christophe2

Affiliation:

1. PHYMAT-CNRS UMR6630, University of Poitiers, 2 Bd Pierre et Marie Curie, Futuroscope 86962, France

2. University of Poitiers, SP2MI Teleport, 2 Bd Marie et Pierre Curie - BP 30179, Futuroscope 86962, France

Abstract

The buckling solutions for a stressed thin film deposited on a semi-infinite rigid substrate have been determined in the framework of the Föppl–von Karman’s theory of thin plates and the perturbed bifurcation theory when pressures are applied onto the lower and upper free surfaces of the buckled film. It is found that the equilibrium solutions of the film are modified compared with the classical case of the Euler column, as well as the critical stress above which the film buckles.

Publisher

ASME International

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics

Reference29 articles.

1. Mixed Mode Cracking in Layered Materials;Hutchinson;Adv. Appl. Mech.

2. Stability of Straight Delamination Blisters;Audoly;Phys. Rev. Lett.

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