Solid-State Microjoining Mechanisms of Wire Bonding and Flip Chip Bonding

Author:

Takahashi Yasuo1,Fukuda Hiroki2,Yoneshima Yasuhiro2,Kitamura Hideki2,Maeda Masakatsu3

Affiliation:

1. Joining and Welding Research Institute, Osaka University, Ibaraki, Osaka 567-0047, Japan

2. Graduate School of Engineering, Osaka University, Yamada-oka, Suita, Osaka 565-0871, Japan

3. Department of Mechanical Engineering, Nihon University, 1-2-1 Narashino, Chiba 275-8575, Japan

Abstract

Low-temperature microjoining, such as wire (or ribbon) bonding, tape automated bonding (TAB), and flip chip bonding (FCB), is necessary for electronics packaging. Each type of microjoining takes on various aspects but has common bonding mechanisms regarding friction slip, plastic deformation, and friction heating. In the present paper, solid-state microjoining mechanisms in Au wire (ball) bonding, FCB, Al wire bonding (WB), and Al ribbon bonding are discussed to systematically understand the common bonding mechanisms. Ultrasonic vibration enhances friction slip and plastic deformation, making it possible to rapidly obtain dry interconnects. Metallic adhesion at the central area of the bonding interface is mainly produced by the friction slip. On the other hand, the folding of the lateral side surfaces of the Au bump, Au ball, and Al wire is very important for increasing the bonded area. The central and peripheral adhesions are achieved by a slip-and-fold mechanism. The solid-state microjoining mechanisms of WB and FCB are discussed based on experimental results.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference102 articles.

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2. The High-Frequency Characteristics of Tape Automated Bonding (TAB) Interconnects;IEEE Trans. Compon. Hybrids Manuf. Technol.,1989

3. Nemoto, T., Hirai, H., Kaneda, K., and Ohdaira, H., 1990, “A Feasibility Study on Single Point TAB for Large Number of Lead Counts and Fine Pitch LSI,” International Microelectronics Conference (IMC), Tokyo, Japan, May 30–June 1, pp. 202–207.

4. Fine Pitch TAB Assembly Technology for 820 Pin Count Ceramic PGA Using Single Point Bonding Technology at Room Temperature;IEEE Trans. Compon. Hybrids, Manuf. Technol.,1993

5. Kurita, Y., Kakegawa, C., and Urushima, M., 1998, “Development of 40 μm Pad Pitch TAB Bumpless Bonding Technology,” 4th Symposium on Microjoining and Assembly Technology in Electronics (MATE), Yokohama, Japan, Jan. 29–30, pp. 53–56.

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