Affiliation:
1. Program Manager Microsystems Technology Office, Defense Advanced Research Projects Agency (DARPA), 675 North Randolph Street, Arlington, VA 22203
Abstract
The thermal management challenges facing electronic system developers and the need, as well as challenges, associated with the development of a Gen-3 embedded cooling paradigm are examined. We argue that the inherent limitations of the prevailing “remote cooling” technology have resulted in commercial and military electronic systems that are thermally-limited, performing well below the inherent electrical capability of the device technology they exploit. To overcome these limitations and remove a significant barrier to continued Moore's law progression in electronic components and systems, DARPA is pursuing the aggressive development of thermal management “embedded” in the chip, substrate, and/or package to directly cool the heat generation sites. The options and challenges associated with the development of this “Gen-3” thermal management technology are described.
Subject
Electrical and Electronic Engineering,General Materials Science,General Medicine
Reference5 articles.
1. Bar-Cohen, A., and Bloschock, K., 2012, “Advanced Thermal Management Technologies for Defense Electronics,” Proceedings, SPIE Defense, Security and Sensing Conference, Baltimore, MD, April.10.1117/12.924349
2. Cooling the Electronic Brain;Mech. Eng.,2011
3. High-Performance Heat Sinking for VLSI;IEEE Electron Device Lett.,1981
4. Two-Phase Thermal Transport in Microgap Channels-Theory, Experimental Results, and Predictive Relations;Microgravity Sci. Technol.,2012
Cited by
43 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献