Intermittent Failures in Hardware and Software

Author:

Bakhshi Roozbeh1,Kunche Surya1,Pecht Michael1

Affiliation:

1. CALCE Electronic Products and Systems Center, Building 89, Room 1103, University of Maryland, College Park, MD 20742 e-mail:

Abstract

Intermittent failures and no fault found (NFF) phenomena are a concern in electronic systems because of their unpredictable nature and irregular occurrence. They can impose significant costs for companies, damage the reputation of a company, or be catastrophic in systems such as nuclear plants or avionics. Intermittent failures in systems can be attributed to hardware failures or software failures. In order to diagnose and mitigate the intermittent failures in systems, the nature and the root cause of these failures have to be understood. In this paper we have reviewed the current literature concerning intermittent failures and have a comprehensive study on how these failures happen, how to detect them and how to mitigate them.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. The ‘Trouble Not Identified’ Phenomenon in Automotive Electronics;Microelectron. Reliab.,2002

2. James, I., Lumbard, D., Willis, I., and Goble, J., 2003, “Investigating No Fault Found in the Aerospace Industry,” Annual Reliability and Maintainability Symposium, Tampa, FL, January 27–30, pp. 441–446.10.1109/RAMS.2003.1182029

3. A System View of the No Fault Found (NFF) Phenomenon;Reliab. Eng. Syst. Saf.,2007

4. Steadman, B., Pombo, T., Madison, I., Shively, J., and Kirkland, L., 2002, “Reducing No Fault Found Using Statistical Processing and an Expert System,” IEEE AUTOTESTCON 2002, Huntsville, AL, October 15–17, pp. 872–878.10.1109/AUTEST.2002.1047966

5. No Fault Found Returns Cost the Mobile Industry $4.5 Billion per Year;WDS White Paper,2006

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Transient risk of water layer formation on PCBAs in different climates: Climate data analysis and experimental study;Microelectronics Reliability;2022-09

2. Unreliable test infrastructures in automotive testing setups;Proceedings of the 44th International Conference on Software Engineering: Software Engineering in Practice;2022-05-21

3. Availability and Reliability Analysis of a k-Out-of-n Warm Standby System with Common-Cause Failure and Fuzzy Failure and Repair Rates;Mathematical Problems in Engineering;2022-05-03

4. Unreliable Test Infrastructures in Automotive Testing Setups;2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP);2022-05

5. Hybrid anomaly detection and prioritization for network logs at cloud scale;Proceedings of the Seventeenth European Conference on Computer Systems;2022-03-28

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3