Dynamic Behavior and Simulation of Nanoparticle Sliding During Nanoprobe-Based Positioning

Abstract

In this paper, the behavior of nanoparticles, manipulated by an atomic force microscope nanoprobe, is investigated. Manipulation by pushing, pulling or picking nanoparticles can result in rolling, sliding, sticking, or rotation behavior. The dynamic simulation of the nanoparticle manipulation, using atomic force microscope (AFM), is performed. According to the dynamics of the system, the AFM pushing force increases to the critical value required for nanoparticle motion. Nanoparticle positioning is designed based on when the nanoparticle is stopped by the AFM in order to move on the substrate. Simulation results for gold particles on a silicon substrate showed that sliding on the substrate is dominant in nanoscales.