Variation Simulations for Digital Panel Assembly

Abstract

This paper presents methodologies and results of variation simulations for digital panel assembly, using GM proprietary software called EAVS. EAVS provides two alternative algorithms for variation simulation of digital panel assembly, i.e., Taylor Series Expansion (TSE) based and Monte Carlo Simulation (MCS) based. In this paper, algorithms of the two methods are reviewed, and pros and cons are studied. Several case studies are presented to illustrate the capabilities of the two methods. Based on the case studies, the EAVS variation simulation guidelines will be established ensuring analysis accuracy at reasonable computational time.