Nonrigid Registration for Form Defect Identification of Thin Parts-Reference-Cited by-同舟云学术

Nonrigid Registration for Form Defect Identification of Thin Parts

Published:2018-04-26 Issue:2 Volume:18 Page:
ISSN:1530-9827
Container-title:Journal of Computing and Information Science in Engineering
language:en
Short-container-title:

Author:

Thiébaut F.¹,Bendjebla S.¹,Quinsat Y.¹,Lartigue C.²

Affiliation:

1. LURPA, ENS Cachan University Paris-Sud, Université Paris-Saclay, Cachan 94235, France e-mail:

2. Professor LURPA, ENS Cachan University Paris-Sud, Université Paris-Saclay, Cachan 94235, France e-mail:

Abstract

The paper discusses thin part inspection using three-dimensional (3D) non rigid registration. The main objective is to match measurement point data to its nominal representation, so as to identify form defects. Since form defects have the same size order as the thickness of the part, establishing such matching is a challenging task. The originality of the method developed in this paper is using a deformable iterative closet point algorithm (ICP), and integrating modal approach to express form defects. The method described improves the matching through iteration of the ICP and establishes a definition of the error. The results of the application show that the present method is efficient.

Publisher

ASME International

Subject

Industrial and Manufacturing Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications,Software

Link

http://asmedigitalcollection.asme.org/computingengineering/article-pdf/doi/10.1115/1.4039640/6102987/jcise_018_02_021012.pdf

Reference20 articles.

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4. Rusinkiewicz, S., and Levoy, M., 2001, “Efficient Variants of the ICP Algorithm,” IEEEThird International Conference on 3D Digital Imaging and Modeling, Quebec City, QC, Canada, May 28–June 1, pp. 145–152.10.1109/IM.2001.924423

5. Huang, Q.-H., Adams, B., Wicke, M., and Guibas, J., 2008, “Non-Rigid Registration Under Isometric Deformations,” Eurographics Symposium on Geometry Processing, Copenhagen, Denmark, July 2–4.

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