Predicting Electrical Resistivity of Sintered Copper Nanoparticles From Simulations for the Microscale Selective Laser Sintering Process

Author:

Dibua Obehi G.1,Tasnim Farzana1,Liao Aaron1,Grose Joshua2,Behera Dipankar3,Foong Chee S.4,Cullinan Michael1

Affiliation:

1. Department of Mechanical Engineering, University of Texas at Austin , Austin, TX 78712

2. Department of Mechanical Engineering, University of Texas at Austin , Austin, TX 78705

3. Department of Mechanical Engineering, University of Texas at Austin , Austin, TX 80020

4. NXP Semiconductors , Austin, TX 78759

Abstract

Abstract One of the main challenges facing the expansion of Additive Manufacturing (AM) is the minimum feature sizes which these processes are able to achieve. Microscale Selective Laser Sintering (μ-SLS) is a novel Additive Manufacturing process created to meet this limitation by precisely laser sintering nanoparticles to give a better control over feature sizes. With the development of this new process, there is a concurrent need for models, which can predict the material properties of the sintering nanoparticles. To this end, this paper presents a novel simulation created to predict the electrical resistivity of sintered copper nanoparticles. Understanding the electrical resistivity of nanoparticles under sintering is useful for quantifying the rate of sintering and has applications such as predicting how the nanoparticles will fuse together when subjected to laser irradiation. Such a prediction allows for in situ corrections to be made to the sintering process to account for heat spreading beyond the intended laser irradiation targets. For these applications, it is important to ensure that the predictions of electrical resistivity from the simulations are accurate. This validation must be done against experimental data and since such experimental data does not currently exist, this paper also presents electrical resistivity data for the laser sintering of copper nanoparticles. In summary, this paper details the simulation methodology for predicting electrical resistivity of laser-sintered copper nanoparticles as well as validation of these simulations using electrical resistivity data from original sintering experiments. The key findings of this work are that the simulations can be used to predict electrical resistivity measurements for sintering of actual copper nanoparticles when the copper nanoparticles do not include other materials such as polymer coatings.

Funder

National Science Foundation

Publisher

ASME International

Subject

Industrial and Manufacturing Engineering,Process Chemistry and Technology,Mechanics of Materials

Reference27 articles.

1. Cramming More Components Onto Integrated Circuits, Reprinted From Electronics, Volume 38, Number 8, April 19, 1965, pp.114 ff.;IEEE Solid-State Circuits Society Newsletter,2006

2. 2001 Technology Roadmap for Semiconductors;Computer,2002

3. Wafer-Level 3D Integration Technology;IBM J. Res. Develop.,2008

4. 3D Silicon Integration,2008

5. A Review on 3D Micro-Additive Manufacturing Technologies;Int. J. Adv. Manuf. Technol.,2013

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3