Analysis of Crack Propagation in Fixed-Free Single-Walled Carbon Nanotube Under Tensile Loading Using XFEM

Author:

Joshi Anand Y.1,Sharma Satish C.1,Harsha S. P.1

Affiliation:

1. Department of Mechanical and Industrial Engineering, Vibration and Noise Control Laboratory, Indian Institute of Technology, Roorkee, Roorkee 247667, Uttarakhand, India

Abstract

Fracture mechanics at the nanoscale level is a very complex phenomenon, whereas the macroscale fracture mechanics approach can be employed for nanoscale to simulate the effect of fracture in single-walled carbon nanotubes (SWCNTs). In this study, an extended finite element method is used to simulate crack propagation in carbon nanotubes. The concept of the model is based on the assumption that carbon nanotubes, when loaded, behave like space frame structures. The nanostructure is analyzed using the finite element method, and the modified Morse interatomic potential is used to simulate the nonlinear force field of the C–C bonds. The model has been applied to single-walled zigzag, armchair, and chiral nanotubes subjected to axial tension. The contour integral method is used for the calculation of the J-integral and stress intensity factors (SIFs) at various crack locations and dimensions of nanotubes under tensile loading. A comparative study of results shows the behavior of cracks in carbon nanotubes. It is observed that for the smaller length of nanotube, as the diameter increased, the stress intensity factor is linearly varied while for the longer nanotube, the variation in stress intensity factor is nonlinear. It is also observed that as the crack is oriented closer to the loading end, the stress intensity factor shows higher sensitivity to smaller lengths, which indicates more chances for crack propagation and carbon nanotube breakage. The SIF is found to vary nonlinearly with the diameter of the SWCNT. Also, it is found that the predicted crack evolution, failure stresses, and failure strains of the nanotubes correlate very well with molecular mechanics simulations from literature.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,General Materials Science,General Medicine

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3