Computer Rigid Disk Surface Assessment With Laser Interferometry Using DDS
Author:
Pandit S. M.1, Jordache N.1, Joshi G. A.1
Affiliation:
1. Engineering Mechanics Department, Michigan Technological University, Houghton, MI, 49931
Abstract
Laser interferometry in conjunction with the data dependent systems (DDS) methodology is first used in this paper to eliminate errors caused by instrumentation and software, and to recover the surface topography of a computer rigid disk used for illustration. The DDS methodology is then applied once more to decompose the surface height profile into a series of exponential and sinusoidal modes. The significant modes are related to the waviness and surface roughness resulting from different manufacturing processes. Surface reconstruction using only the important modes is presented. This provides a visual as well as mathematical description of the resultant effect of each process. The methodology can characterize very complex surface textures, reducing the reliance on complicated and expensive instruments needed for inspection, and replacing them with relatively inexpensive but reliable computation.
Publisher
ASME International
Subject
Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Control and Systems Engineering
Reference20 articles.
1. Bhushan
B.
, WyantJ. C., KoliopoulosC. L., 1985, “Measurement of Surface Topography of Magnetic Tapes by Mirau Interferometry,” Applied Optics, Vol. 24, No. 10, pp. 1489–1497. 2. Bruning, J. H., 1978, Ch. 13 in Optical Shop Testing, by Daniel Malacara, ed., Mexico, reprinted by John Wiley. 3. Bruning
J. H.
, HerriottD. R., GallagherJ. E., RosenfeldD. P., WhiteA. D., and BrangacioD. J., 1974, “Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses,” Applied Optics, Vol. 13, No. 11, pp. 2693–2696. 4. Creath, K., 1988, “Temporal Phase Measurement Methods,” in Progress in Optics, Vol. XXVI, E. Wolf, ed., Elsevier Science Publishers, Amsterdam, pp. 349–393. 5. Ichioca
Y.
, and InuiyaM., 1972, “Direct Phase Detecting System,” Applied Optics, Vol. 11, No. 7, pp. 1507–1510.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
|
|