Multistack Close Range Photogrammetry for Low Cost Submillimeter Metrology
Author:
Affiliation:
1. e-mail:
2. e-mail: Dipartimento di Meccanica, Matematica e Management, Politecnico di Bari, Viale Japigia 182, Bari 70126, Italy
Abstract
Publisher
ASME International
Subject
Industrial and Manufacturing Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications,Software
Link
http://asmedigitalcollection.asme.org/computingengineering/article-pdf/doi/10.1115/1.4024973/6099509/jcise_013_04_044501.pdf
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3. Raw Part Characterization and Automated Alignment by Means of a Photogrammetric Approach;CIRP Ann. Manuf. Technol.,2012
4. Surface Determination With an Accuracy of Few Microns, International Archives of Photogrammetry and Remote Sensing,1992
5. Digital Photogrammetry and Microscope Photographs;Photogramm. Rec.,1999
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