Laser Reflection as a Simple Prospect Tool for Nondestructive Quality Control of Charged Lapping Plates

Author:

Mayen-Mondragon Rodrigo1,Avila-Herrera Carlos Alberto2,Herrera-Gomez Alberto2,Yanez-Limon Jose Martin2,Ramirez-Bon Rafael2

Affiliation:

1. Facultad de Química, Polo Universitario de Tecnología Avanzada, Universidad Nacional Autónoma de México, Vía de la Innovación No. 410, Autopista MTY-Aeropuerto Km. 10, PIIT, Apodaca 66629, Nuevo León, México e-mail:

2. Centro de Investigación y de Estudios Avanzados del I.P.N., Unidad Querétaro, Libramiento Norponiente No. 2000, Fracc. Real de Juriquilla, Querétaro 76230, Querétaro, México e-mail:

Abstract

In the present work, a simple laser/detector-based system was assembled and mounted in situ at the production line of the Hitachi hard-disk recording-head facilities in Mexico. The system was set to scan the surface of rotating lapping plates charged during time windows of varying lengths. The specular-reflection component was measured as a function of angular distance along the plate surface. The optical system showed enough sensitivity to follow the incorporation of abrasive into the plate surface. Moreover, two different charging stages were identified. Relevant topographical information could also be extracted. For example, the data distribution skewness was used to identify major surface defects, such as scratches. The reflection-signal spatial pattern was matched to that of the lapping plate topographer (LPT) surface profile by means of a coherence-spectrum analysis. The system assembly is relatively straightforward and it occupies little space. Thus, it could become a compact multitask substitute or complement of larger equipment at the manufacturing line. Note that even when the data analysis performed has led to promising results, the technique still needs to be fine-tuned in order to increase its precision and reliability.

Publisher

ASME International

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanical Engineering,Mechanics of Materials

Reference14 articles.

1. Nanogrinding;Precis. Eng.,1997

2. Reflectance Surface Analyzer,2007

3. Tribology Applications of Surface Reflectance Analyzers: Optical Characterization of the Head Disk Interface;Tribol. Int.,2000

4. Optical Method and Apparatus for Surface Roughness Evaluation,1979

5. Particle Detection System With Reflective Line-to-Spot Collector,1995

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3