Pole Tip Recession: Investigation of Factors Affecting Its Measurement and Its Variation With Contact Start-Stop and Constant Speed Drag Testing

Author:

Nadimpalli Chandrasekhar1,Talke Frank E.1,Smallen Martin2,Lee Jerry J. K.2

Affiliation:

1. Center For Magnetic Recording Research, University of California, San Diego, La Jolla, CA 92093-0401

2. Conner Peripherals, San Jose, CA 95134-2128

Abstract

Optical interferometry and contact mode atomic force microscopy are used to investigate the various factors that influence the measurement of pole tip recession. These factors include: (a) effect of dissimilar materials on optical interferometry results, (b) size and location of the air bearing surface used as the reference area, (c) the effect of slider crown, (d) the magnification of the objective used in optical interferometry and (e) the dependence of the AFM measurements on slider materials and scan direction of the AFM tip. The possibility of determining a local value of pole tip recession is examined wherein the sputtered alumina, rather than the Al2O3-TiC surface, is used as the reference surface. Finally, the effect of contact start/stop (CSS) and constant speed drag testing on pole tip recession is investigated by measuring the change in pole tip recession as a function of the number of start/stop and constant speed drag cycles.

Publisher

ASME International

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanical Engineering,Mechanics of Materials

Reference8 articles.

1. Li Y. , and TalkeF. E., 1990, “Limitations and Corrections of Optical Profilometry in Surface Characterizations of Carbon Coated Magnetic Recording Disks,” ASME JOURNAL OF TRIBOLOGY, Vol. 112, pp. 670–677.

2. Maissel, L. I., and Glang, V. R., 1970, Handbook of Thin Film Technology, McGraw-Hill, New York, pp. 23–27.

3. Smallen M. , and LeeJ. J. K., 1993, “Pole Tip Recession Measurements on Thin Film Heads Using Optical Profilometry With Phase Correction and Atomic Force Microscopy,” Trans. ASME, Vol. 115, pp. 382–386.

4. Smythe, R., Selberg, L., and Deck, L., 1992, “Pole Tip Recession Measurements of Transducers on Thin Film Sliders for Rigid Disk Drives,” Paper presented at the International Disk Conference, Tokyo, Japan.

5. Topometrix Technical Report, 1993a, “AFM Imaging Modes,” Topometrix Corporation, Santa Clara, CA.

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