Affiliation:
1. Department of Computer Science, Technion-Israel Institute of Technology, Haifa 32000, Israel
Abstract
We consider the task of sequential point sampling for three-dimensional structure reconstruction and focus on terrestrial topographic mapping using a laser range scanner. Both the sampling and the reconstruction rely on a stochastic model of the sampled object. We describe several algorithms for sequential point sampling including a new adaptive algorithm that is specifically designed for mechanical devices and produces grid-like sampling patterns. Experimental results verify that relying on the stochastic model indeed leads to efficient sampling associated with accurate surface reconstruction.
Subject
Industrial and Manufacturing Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications,Software
Cited by
2 articles.
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