A Thermo-Mechanical Approach for Fatigue Testing of Polymer Bimaterial Interfaces

Author:

Gurumurthy C. K.1,Jiao J.1,Norris L. G.1,Hui C.-Y.2,Kramer E. J.3

Affiliation:

1. Materials Science and Engineering, Cornell University, Ithaca, NY 14850

2. Theoretical and Applied Mechanics, Cornell University, Ithaca, NY 14850

3. Department of Materials, University of California at Santa Barbara, Santa Barbara, CA 93106

Abstract

We have developed a new technique that uses a noncontact fiber optic displacement sensor to investigate the crack growth along polymer interfaces under thermal fatigue conditions. This technique has been used to test the underfill/passivation interface of a direct chip attach (DCA) assembly, the thermal fatigue driven delamination of which is a major cause for failure of DCA assemblies. The sample is prepared as a multilayered cantilever beam by capillary flow of the underfill over a polyimide coated metallic beam. During thermal cycling the crack growth along the interface from the free end changes the displacement of this end of the beam and we measure this displacement at the lowest temperature in each thermal cycle. The change in beam displacement is converted into crack growth knowing the geometry of the specimen. The crack growth rate depends on the maximum difference in the strain energy release rate of the crack in each cycle and the mechanical phase angle. This paper outlines the theoretical basis of the technique and provides initial results obtained for a variety of underfills dispensed over a commercial (PMDA/ODA) polyimide. The technique was validated by comparing the crack growth measured by displacement changes with direct optical microscopy measurements of the crack length.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Borgesen, P., 1996, private conversation, DCA Consortium, Universal Instruments Corporation, Binghamton, NY.

2. Burkhart, A., Naito, C., and Goodrich, B., 1994, “New Generation Encapsulants for Chips on Low Cost First Level Substrates,” Proceedings-NEPCON West 1994, Vol. II, Anaheim, CA, pp. 1503–1511.

3. Compass Core Report, 1995, No. 567, BPA, Cold Spring Harbor, NY.

4. Gurumurthy, C. K., 1996, “Warpage in Area Array Microelectronic Devices,” M.S. thesis, State University of New York at Binghamton, Binghamton, NY.

5. Gurumurthy, C. K., Norris, L. G., Hui, C. Y., and Kramer, E. J., 1998, “Characterization of Underfill/Passivation Interfacial Adhesion for Direct Chip Attach Assemblies Using Fracture Toughness and Hydro-Thermal Fatigue Measurements,” submitted to the 48th ECTC conference.

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