Potential Failure Sites in a Flip-Chip Package With and Without Underfill
Author:
Affiliation:
1. Department of Aerospace and Mechanical Engineering, The University of Arizona, Tucson, AZ 85726
2. Intel Corporation, Chandler, AZ 85226
Abstract
Publisher
ASME International
Subject
Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials
Link
http://asmedigitalcollection.asme.org/electronicpackaging/article-pdf/120/4/336/5801383/336_1.pdf
Reference9 articles.
1. Jackson, R., and Carnevali, P., 1991, “Finite Element Modeling of Encapsulated Flip-Chip Packaging Assemblies,” Proceedings 1991 International Symposium on Microelectronics, ISHM, pp. 82–85.
2. Le Gall, A. C., Jianmin, Q., and McDowell, D. L., 1996, “Delamination Cracking in Encapsulated Flip Chips,” 46th Electronic Components and Technology Conference Proceedings, IEEE, Piscataway, NJ, pp. 430–434.
3. Madenci, E., Shkarayev, S., and Sergeev, B., 1998, “Thermo-Mechanical Systems in Regions of Dissimilar Materials via Global-Local Finite Element Analysis,” Theoretical and Applied Fracture Mechanics, in press.
4. Munz D. , FettT., and YangY. Y., 1993, “The Regular Stress Term in Bonded Dissimilar Materials After a Change in Temperature,” Engineering Fracture Mechanics, Vol. 44, pp. 185–194.
5. Persson, E., Madenci, E., and Ericksson, I., 1998, “Prediction of Delamination Initiation in Laminates with Pin-Loaded Holes,” Theoretical and Applied Fracture Mechanics, in press.
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