Affiliation:
1. Digital Equipment Corporation, ML05-3/E35, Maynard, MA 01754
Abstract
The Built-up-Bar (BUB) theory is presently gaining recognition in microelectronics. This theory offers a useful method for computing stresses and strains in multilayered structures. However, it cannot be safely applied outside of the inherent assumptions that facilitated the convenient simplification of the general equations. This paper discusses methods for solution of basic equations of the BUB theory and cautions analysts about certain pitfalls.
Subject
Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials
Cited by
8 articles.
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