Multiple Quality Characteristics Optimization of Ball Grid Array Wire Bonding Process

Author:

Yih-Fong Tzeng1,Fu-Chen Chen2,Chih-Huang Chen1

Affiliation:

1. Department of Mechanical and Automation Engineering, National Kaohsiung First University of Science and Technology, Kaohsiung City 811, Taiwan

2. Department of Mechanical Engineering, Kun-Shan University, YongKang District, Tainan City 710, Taiwan

Abstract

This paper presents an integrated approach combining principal component analysis (PCA) and Taguchi methods to develop a ball grid array (BGA), gold (Au) wire bonding process with multiple quality characteristics optimization. Eight main process factors of BGA wire bonding technology are selected as the control factors for parameter design. They are the factor A (seating ultrasonic generator (USG)), factor B (TIP height), factor C (C/V), factor D (USG current), factor E (USG bond time), factor F (bond force), factor G (FS threshold), and factor H (FAB size). The quality characteristics of the process in the study, including the wire pull strength, the ball shear strength, the ball thickness difference, the ball size difference, and the percentage of the Au–Al intermetallic compound (IMC) are measured. The optimal process parameters that meet the requirements for multiple quality characteristics are A1B3C1D3E3F1G1H2. They are then used to be tested for verification. Experimental results confirm that the optimal process design indeed enhances the quality characteristics investigated. The analysis of variance (ANOVA) results also show that the most important control factors affecting the quality characteristics are factor B (TIP height), factor C (C/V), and factor G (FS threshold), which accounts for 72.34% of total process variance. Thus, they must be strictly monitored during processing.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. Advances in Wire Bonding Technology for High Lead Count;IEEE Trans. Compon., Hybrids, Manuf. Technol.,1988

2. Wire-Bonding Process Development for Low-K Materials;J. Microelectron. Eng.,2005

3. Shen, L., Gumaste, V., Poddar, A., and Nguyen, L., 2006, “Effect of Pad Stacks on Dielectric Layer Failure During Wire Bonding,” IEEE 56th Proceedings of Electronic Components and Technology Conference (ECTC), San Diego, CA, May 30–June 2, p. 6.10.1109/ECTC.2006.1645638

4. Failure Estimation of Semiconductor Chip During Wire Bonding Process;ASME J. Electron. Packag.,1999

5. Shu, B., 1991, “Fine Pitch Wire Bonding Development Using a New Multipurpose, Multi-Pad Pitch Test Die,” IEEE 41st Proceedings of Electronic Component and Technology Conference (ECTC), Atlanta, GA, May 11–16, pp. 511–518.10.1109/ECTC.1991.163925

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3