Electrically Conductive Adhesive Formulations for SMT Applications

Author:

Kisiel Ryszard1

Affiliation:

1. Warsaw University of Technology, Institute of Microelectronics and Optoelectronics, ul. Koszykowa 75 00-662, Warszawa, Poland

Abstract

The aim of current research presented in my paper is to establish how adhesive composition influences the performance of joints between SMDs and PCBs. For identifying the best adhesive formulation in SMT applications, the experiment design method based on Taguchi techniques for quality engineering has been used. It was decided to investigate how the following controllable factors: type of isolating resin, levels of weight content of Ag filler, presence of adhesive promoter and spread improver as well as PCB pads finishing influences the performance of adhesive joints. As the figure-of-merit, the individual joint resistance and adhesion between SMDs and PCBs were measured. It was found that the type of resin had the biggest influence on electrical and mechanical properties of adhesive joints.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Wong, C. P., and Daoqiang Lu, 2000, “Recent Advances on Electrically Conductive Adhesives for Electronics Applications,” Proc. of 4th International Conference on Adhesive Joining & Coating Technology in Electronics Manufacturing, Espoo, Finland 18–21 June, p. 121.

2. Rosenberd, Halle, 1992, “Electrically Conductive Adhesives for SMT,” Elektronik Centralen, Denmark, Aug.

3. Kisiel, R., 2000, “The Influence of Adhesive Composition on Mechanical and Electrical Properties of Joints between SMDs and PCBs,” Proc. of 4th International Conference on Adhesive Joining & Coating Technology in Electronics Manufacturing, Espoo, Finland, June 18–21, p. 240.

4. Kisiel, R., and Mos´cicki, A., 2000, “Electrically conductive adhesives in SMT–the influence of adhesive composition on mechanical and electrical properties,” Proc. of XXIV IMAPS Conference, Rytro, Poland, September 25–28, p. 199.

5. Ross, P. J., 1988, “Taguchi Techniques for Quality Engineering,” McGraw-Hill, New York,

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