A Compilation of Drug Etiologies of Stevens-Johnson Syndrome and Toxic Epidermal Necrolysis
Author:
Publisher
Springer Science and Business Media LLC
Subject
Aerospace Engineering
Reference129 articles.
1. Stevens-Johnson syndrome and toxic epidermal necrolysis are severity variants of the same disease which differs from erythema multiforme;Roujeau JC;J Dermatol,1997
2. The epidemiology of Stevens-Johnson syndrome and toxic epidermal necrolysis in the UK;Frey N;J Invest Dermatol,2017
3. Toxic epidermal necrolysis (Lyell syndrome). Incidence and drug etiology in France, 1981-1985;Roujeau JC;Arch Dermatol,1990
4. Stevens-Johnson syndrome and toxic epidermal necrolysis. pathogenesis, clinical manifestations, and diagnosis. (2022). Accessed: November 5, 2022: https://www.uptodate.com/contents/stevens-johnson-syndrome-and-toxic-epidermal-necrolysis-pathogenesis-clinical-manif....
5. Comprehensive survival analysis of a cohort of patients with Stevens-Johnson syndrome and toxic epidermal necrolysis;Sekula P;J Invest Dermatol,2013
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The Occurrence of Etoricoxib-Induced Stevens-Johnson Syndrome With Oral Manifestations in a Female Patient: A Case Study;Cureus;2024-06-28
2. Stevens–Johnson Syndrome and Toxic Epidermal Necrolysis: Analysis of the Russian Database of Spontaneous Reports;Pharmaceuticals;2024-05-24
3. Evaluation of the Factors Influencing Mortality in Patients with Stevens-Johnson Syndrome and Toxic Epidermal Necrolysis: A Multicenter Study of 166 Patients;Dermatology and Therapy;2024-05-17
4. Unveiling sultam in drug discovery: spotlight on the underexplored scaffold;RSC Medicinal Chemistry;2024
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3