Crystallographic Orientation and Microstructure Dependences of Surface Potential for Annealed S45C Steel Using Combined Scanning Kelvin Force Probe Microscopy and Electron Backscatter Diffraction Analyses-Reference-Cited by-同舟云学术

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Crystallographic Orientation and Microstructure Dependences of Surface Potential for Annealed S45C Steel Using Combined Scanning Kelvin Force Probe Microscopy and Electron Backscatter Diffraction Analyses

Published:2022-03-01 Issue:3 Volume:86 Page:35-42
ISSN:0021-4876
Container-title:Journal of the Japan Institute of Metals and Materials
language:en
Short-container-title:J. Japan Inst. Metals and Materials

Author:

Murase Yoshiharu¹,Masuda Hiroyuki¹,Katayama Hideki¹

Affiliation:

1. National Institute for Materials Science

Publisher

Japan Institute of Metals

Subject

Materials Chemistry,Metals and Alloys,Mechanics of Materials,Condensed Matter Physics

Link

https://www.jstage.jst.go.jp/article/jinstmet/86/3/86_J2021045/_pdf

Reference23 articles.

1. 1) M. Stratmann and H. Steckel: Corros. Sci. 30 (1990) 681-696. doi:10.1016/0010-938X(90)90032-Z

2. 2) C. Örnek and D.L. Engelberg: Corros. Sci. 99 (2015) 164-171. doi:10.1016/j.corsci.2015.06.035

3. 3) A.B. Cook, Z. Barrett, S.B. Lyon, H.N. McMurray, J. Walton and G. Williams: Electrochim. Acta 66 (2012) 100-105. doi:10.1016/j.electacta.2012.01.054

4. 4) V. Guillaumin, P. Schmutz and G.S. Frankel: J. Electrochem. Soc. 148 (2001) B163-B173. doi:10.1149/1.1359199

5. 5) H.O. Jacobs, H.F. Knapp and A. Stemmer: Rev. Sci. Instrum. 70 (1999) 1756-1760. doi:10.1063/1.1149664

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