Mapping of Microscopic and Local Stress-Strain Curve Information by Combination of Digital Image Correlation and High-Resolution Electron Backscatter Diffraction Methods-Reference-Cited by-同舟云学术

Mapping of Microscopic and Local Stress-Strain Curve Information by Combination of Digital Image Correlation and High-Resolution Electron Backscatter Diffraction Methods

Published:2024-09-01 Issue:9 Volume:88 Page:216-225
ISSN:0021-4876
Container-title:Journal of the Japan Institute of Metals and Materials
language:en
Short-container-title:J. Japan Inst. Metals

Author:

Yamasaki Shigeto¹,Matsuo Hirofumi²,Morikawa Tatsuya¹,Tanaka Masaki¹

Affiliation:

1. Department of Materials, Faculty of Engineering, Kyushu University

2. Department of Materials, Graduate School of Engineering, Kyushu University

Publisher

Japan Institute of Metals

Link

https://www.jstage.jst.go.jp/article/jinstmet/88/9/88_J202404/_pdf

Reference34 articles.

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