Thermal Conductivity Measurement of Tungsten Oxide Nanoscale Thin Films
Author:
Affiliation:
1. Materials Database Station, National Institute for Materials Science
2. Materials Engineering Laboratory, National Institute for Materials Science
Publisher
Japan Institute of Metals
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
https://www.jstage.jst.go.jp/article/matertrans/47/8/47_8_1894/_pdf
Reference12 articles.
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3. 3) C. Cantaalini, H. T. Sun, M. Faccio, M. Pelino, S. Santucci, L. Lozzi and M. Passacantando: Sensors Actuators B 31 (1996) 81–87.
4. 4) A. Agrawal and H. Habibi: Thin Solid Films 169 (1989) 257–270.
5. 5) H. Meixner, J. Gerblinger, U. Lampe and M. Fleischer: Sensors Actuators B 23 (1995) 119–125.
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