Yield Point Phenomenon Induced by Twinning Accompanied by Abnormal Grain Growth in Fine-Grained Copper
Author:
Affiliation:
1. Department of Materials Science and Engineering & Research Institute of Advanced Materials, Seoul National University
2. Agency for Defense Development
3. Semiconductor R&D Center, Samsung Electronics
Publisher
Japan Institute of Metals
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
https://www.jstage.jst.go.jp/article/matertrans/63/10/63_MT-MB2022002/_pdf
Reference52 articles.
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3. 3) N. Petch: J. Iron Steel Inst. 174 (1953) 25–28.
4. 4) V. Segal: Mater. Sci. Eng. A 197 (1995) 157–164. doi:10.1016/0921-5093(95)09705-8
5. 5) Y. Iwahashi, Z. Horita, M. Nemoto and T.G. Langdon: Acta Mater. 46 (1998) 3317–3331. doi:10.1016/S1359-6454(97)00494-1
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