Growth Features of Ag/Pb and Cu/Pb Multilayered Films Studied by <I>In situ</I> Electrical Resistivity Measurements-Reference-Cited by-同舟云学术

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Growth Features of Ag/Pb and Cu/Pb Multilayered Films Studied by In situ Electrical Resistivity Measurements

Published:1993 Issue:1 Volume:34 Page:7-12
ISSN:0916-1821
Container-title:Materials Transactions, JIM
language:en
Short-container-title:Mater. Trans., JIM

Author:

Kozaki Jun’ichi¹,Hazama Katsuki¹,Nittono Osamu¹,Hamamura Kenji²

Affiliation:

1. Department of Metallurgical Engineering, Tokyo Institute of Technology

2. Industrial Mechanical Engineering, The Institute of Vocational Training

Publisher

Japan Institute of Metals

Subject

General Engineering

Link

https://www.jstage.jst.go.jp/article/matertrans1989/34/1/34_1_7/_pdf

Reference10 articles.

1. 1) G. Desrousseaux, A. Carian, R. Faure, H. Schaffar, B. Robrieux and J. P. Dussaulcy: Thin Solid Films, 109 (1983), 313.

2. 2) G. Desrousseaux, B. Robrieux, A. Renou, H. Schaffar and M. Gillet: Z. Phys. D., 12 (1989), 23.

3. 3) B. Robrieux, G. Desrousseaux, A. Renou and M. Gillet: Z. Phys. D., 12 (1989), 27.

4. 4) M. Jalochowski and P. Mikolajczak: J. Phys. F: Met. Phys., 13 (1987), 1973.

5. 5) K. J. Rawlings, W. J. Gibson and P. J. Dobson: J. Phys. D, 11 (1978), 2059.

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