Angle Resolved XPS for Characterizing Thin Oxide Films Formed on the Surface of Fe-10, 20 and 30 mass% Cr Alloys Exposed to Air
Author:
Affiliation:
1. Institute for Advanced Materials Processing, Tohoku University
Publisher
Japan Institute of Metals
Subject
General Engineering
Link
https://www.jstage.jst.go.jp/article/matertrans1989/36/11/36_11_1379/_pdf
Reference22 articles.
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3. 3) G. W. Simmons and D. J. Dwyer: Surf., Sci., 48 (1975), 373.
4. 4) Y. Sakisaka, H. Kato and M. Onchi: Surf. Sci., 120 (1982), 150.
5. 5) J. S. Foord and R. M. Lambert: Surf. Sci., 161 (1985), 513.
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