Quantification of Sulfur in Copper by Secondary Ion Mass Spectrometry (SIMS)-Reference-Cited by-同舟云学术

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Quantification of Sulfur in Copper by Secondary Ion Mass Spectrometry (SIMS)

Published:1996 Issue:5 Volume:37 Page:1004-1007
ISSN:0916-1821
Container-title:Materials Transactions, JIM
language:en
Short-container-title:Mater. Trans., JIM

Author:

Nakada Yoshinobu¹,Mine Kazuhisa¹,Koutsuka Toshimoto¹,Sassa Koichi¹

Affiliation:

1. Central Research Institute, Mitsubishi Materials Corporation

Publisher

Japan Institute of Metals

Subject

General Engineering

Link

https://www.jstage.jst.go.jp/article/matertrans1989/37/5/37_5_1004/_pdf

Reference9 articles.

1. 1) J. S. Smart and A. A. Smith: Trans. AIME, 147 (1942), 48.

2. 2) N. Ishida and T. Iwamura: Journal of the Japan Copper and Brass Research Association, 31 (1992), 187.

3. 3) C. A. Evans, Jr.: Anal. Chem., 42 (1970), 1130.

4. 4) T. Nishi, T. Sano, H. Takeshita, T. Oishi and K. Ono: J. Japan Inst. Metals, 54 (1990), 692.

5. 5) Y. Nakada, T. Koutsuka, K. Mine and H. Suga: Secondary Ion Mass Spectrometry SIMS IX, John Wiley & Sons, (1994), p. 199.

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